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Microsensors Research Laboratory
Directors: Professors
Donald P. Butler and
Zeynep Celik-Butler
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The microsensors research laboratory is used in the
design, fabrication and characterization of microsensor materials and
devices. It provides measurement capabilities from 2K to 450K. Two
low-temperature Dewars, two closed-cycle Helium refrigerators, one open
cycle Helium cryostat, various cryogenic inserts, microprocessor-based
programmable temperature controllers, temperature sensors, and fiber optic
instrumentation support the variable temperature characterization of
microsensors. The optical characterization facilities include an Oriel MS257
spectrometer/monochrometer, two IR sources, calibrated pyroelectric
detectors, various fiber optic components, laser diodes and Oriel 7 GHz
photodiodes. The monochrometer/spectrometer and IR sources allow the
characterization of devices and materials from 1 - 12 mm
IR wavelength. Computer workstations are used as system controllers for
data acquisition and modeling. |
Pulsed Laser Deposition Laboratory
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The facility consists of Neocera turn-key pulsed laser
deposition system. The system consists of an 18 inch, turbo pumped vacuum
chamber. The system has a 3 inch rf sputter gun in addition to a 6-target
PLD carousel. The substrate can be heated to 950 oC. The system
uses a Lambda-Physik Compex 301 KrF excimer laser operating at 248 nm. The
laser produces up to 1 Joule per pulse with a repition rate of 1 to 10 Hz.
The PLD system was purchased through a grant from the
National Science Foundation .
The PLD system is used primarily for the deposition of ferroelectric and
pyroelectric materials used in uncooled infrared detectors. Other
bolometric, superconductive, and optoelectronic materials are also
investigated. |
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Looking through the view port of the vacuum chamber, one
sees a view of the plasma plume created when the laser pulse strikes the
target. The plume includes target material traveling through the low
pressure atmosphere towards the substrate being coated by the thin film.
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