facility is used for the characterization and modeling of solid state devices
and electronic materials. The laboratory has the capability for the computerized
I-V, C-V, microwave, optical, and noise characterization of devices. Full
semiconductor parameter analysis, extraction and modeling are available.
Frequencies from few µHz to
4.5 GHz are covered. This lab is designed for computer controlled data
acquisition and modeling.
The labs contains a 6 ft. x 6 ft. shielded room with a noise attenuation of 100
dB to electric fields and plane waves from 14 kHz to 10 GHz and 30 dB to
magnetic fields at 60 Hz. A continuous flow passive cryostat in the shielded
room ensures low-noise, low temperature measurements. Several shielded
microprobe stations allow wafer level characterization of unpackaged devices.