Directors: Professors Donald P. Butler and Zeynep Celik-Butler
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This facility is used for the characterization and modeling of solid state devices and electronic materials. The laboratory has the capability for the computerized I-V, C-V, microwave, optical, and noise characterization of devices. This lab is designed for computer controlled data acquisition and modeling. |
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The electrical and noise characterization facilities include an HP-UX workstation running IC-CAP with a HP4142 source monitor unit and HP4284 LCR meter for I-V and C-V characterization and an electromagnet for Hall-effect measurements. The labs also contains a 6 ft. x 6 ft. shielded room with a noise attenuation of 100 dB to electric fields and plane waves from 14 kHz to 10 GHz and 30 dB to magnetic fields at 60 Hz. The lab includes three low frequency dynamic signal analyzers, several trans-impedance pre-amplifiers and voltage pre-amplifiers, lock-in amplifiers, various programmable multimeters, oscilloscopes, and LCR meters plus plotters and printers, and system controllers. The microwave measurement equipment includes a 200 KHz to 22 GHz HP71200A spectrum analyzer, an HP54120T 20 GHz sampling oscilloscope, an Agilent Infiniium 4 GHz Oscilloscope, Wavetek 2520 2.2 GHz Frequency Synthesizer, microwave power meters, and various microwave components and amplifiers. |